HDDが壊れるとどうなるのか
復旧する前に確認しておくことにした。
smart でエラーが見られるのですが、いままで手元のHDDがエラーを出したことがなかった。
エラーが出たので記念に残すことにした。
Smartでエラーが出たらこうなります。ってのを覚えておくと、復旧や調査に役に立つとおもうので残しておくことにする。
takuya@:~$ sudo smartctl -a /dev/sdb smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Green (Adv. Format) Device Model: WDC WD20EARS-00MVWB0 Serial Number: WD-WMAZA0636931 LU WWN Device Id: 5 0014ee 6ab131a6e Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Sat Jun 4 21:25:12 2016 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (39300) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 146 146 051 Pre-fail Always - 116358 3 Spin_Up_Time 0x0027 174 159 021 Pre-fail Always - 6291 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 383 5 Reallocated_Sector_Ct 0x0033 166 166 140 Pre-fail Always - 736 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 036 036 000 Old_age Always - 47139 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 259 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 204 193 Load_Cycle_Count 0x0032 053 053 000 Old_age Always - 443158 194 Temperature_Celsius 0x0022 114 084 000 Old_age Always - 36 196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 421 197 Current_Pending_Sector 0x0032 199 197 000 Old_age Always - 537 198 Offline_Uncorrectable 0x0030 200 141 000 Old_age Offline - 290 199 UDMA_CRC_Error_Count 0x0032 200 181 000 Old_age Always - 209 200 Multi_Zone_Error_Rate 0x0008 122 001 000 Old_age Offline - 20879 SMART Error Log Version: 1 ATA Error Count: 51642 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 51642 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 02 00 00 00 a0 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 10 02 00 00 00 a0 08 22d+07:01:03.463 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.458 IDENTIFY DEVICE ef 03 46 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Set transfer mode] ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE Error 51641 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 46 00 00 00 a0 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 46 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Set transfer mode] ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA] Error 51640 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 02 00 00 00 a0 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.448 IDENTIFY DEVICE Error 51639 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 02 00 00 00 a0 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.448 IDENTIFY DEVICE ef 03 46 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Set transfer mode] ef 10 02 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.443 IDENTIFY DEVICE Error 51638 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 46 00 00 00 a0 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 46 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Set transfer mode] ef 10 02 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 22d+07:01:03.443 IDENTIFY DEVICE ef 10 02 00 00 00 a0 08 22d+07:01:03.443 SET FEATURES [Reserved for Serial ATA] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
ちなみに正常なときは
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 181 167 021 Pre-fail Always - 5941 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 654 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 047 047 000 Old_age Always - 39322 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 226 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 192 193 Load_Cycle_Count 0x0032 162 162 000 Old_age Always - 115939 194 Temperature_Celsius 0x0022 116 085 000 Old_age Always - 34 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 3 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
こんな感じ。
エラーレートがこんな数字でも動くんだからHDDってすごい。
READメインディスクだし、別にどうってこと無い。RAIDでソコまで気にしなくても良いんだなぁって思う。限界まで行くぜ
RAID方式に変わる、HDD 式年遷宮方式
RAIDによるミラーリングは、メンテコストや初期投資、初期設定コストがかかるので、伊勢神宮の式年遷宮と同様に、一定期間経過後に、HDDの中身を新しいHDDに丸ごとお引越しするHDD式年遷宮を、お手軽なバックアップとデータ担保の手法として名付けたい。