HDDが壊れるとどうなるのか
復旧する前に確認しておくことにした。
smart でエラーが見られるのですが、いままで手元のHDDがエラーを出したことがなかった。
エラーが出たので記念に残すことにした。
Smartでエラーが出たらこうなります。ってのを覚えておくと、復旧や調査に役に立つとおもうので残しておくことにする。
takuya@:~$ sudo smartctl -a /dev/sdb
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green (Adv. Format)
Device Model: WDC WD20EARS-00MVWB0
Serial Number: WD-WMAZA0636931
LU WWN Device Id: 5 0014ee 6ab131a6e
Firmware Version: 51.0AB51
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sat Jun 4 21:25:12 2016 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (39300) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 146 146 051 Pre-fail Always - 116358
3 Spin_Up_Time 0x0027 174 159 021 Pre-fail Always - 6291
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 383
5 Reallocated_Sector_Ct 0x0033 166 166 140 Pre-fail Always - 736
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 036 036 000 Old_age Always - 47139
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 259
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 204
193 Load_Cycle_Count 0x0032 053 053 000 Old_age Always - 443158
194 Temperature_Celsius 0x0022 114 084 000 Old_age Always - 36
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 421
197 Current_Pending_Sector 0x0032 199 197 000 Old_age Always - 537
198 Offline_Uncorrectable 0x0030 200 141 000 Old_age Offline - 290
199 UDMA_CRC_Error_Count 0x0032 200 181 000 Old_age Always - 209
200 Multi_Zone_Error_Rate 0x0008 122 001 000 Old_age Offline - 20879
SMART Error Log Version: 1
ATA Error Count: 51642 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 51642 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 08 22d+07:01:03.463 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.458 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE
Error 51641 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE
ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA]
Error 51640 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 08 22d+07:01:03.458 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.453 IDENTIFY DEVICE
ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.448 IDENTIFY DEVICE
Error 51639 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 08 22d+07:01:03.453 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.448 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.443 IDENTIFY DEVICE
Error 51638 occurred at disk power-on lifetime: 28060 hours (1169 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 08 22d+07:01:03.448 SET FEATURES [Reserved for Serial ATA]
ec 00 00 00 00 00 a0 08 22d+07:01:03.443 IDENTIFY DEVICE
ef 10 02 00 00 00 a0 08 22d+07:01:03.443 SET FEATURES [Reserved for Serial ATA]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
ちなみに正常なときは
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 181 167 021 Pre-fail Always - 5941 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 654 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 047 047 000 Old_age Always - 39322 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 226 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 192 193 Load_Cycle_Count 0x0032 162 162 000 Old_age Always - 115939 194 Temperature_Celsius 0x0022 116 085 000 Old_age Always - 34 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 3 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
こんな感じ。
エラーレートがこんな数字でも動くんだからHDDってすごい。
READメインディスクだし、別にどうってこと無い。RAIDでソコまで気にしなくても良いんだなぁって思う。限界まで行くぜ
RAID方式に変わる、HDD 式年遷宮方式
RAIDによるミラーリングは、メンテコストや初期投資、初期設定コストがかかるので、伊勢神宮の式年遷宮と同様に、一定期間経過後に、HDDの中身を新しいHDDに丸ごとお引越しするHDD式年遷宮を、お手軽なバックアップとデータ担保の手法として名付けたい。
